二碲化铪晶体 HfTe2(Hafnium Telluride)

　　晶体尺寸：~10毫米

　　电学性能：半金属

　　晶体结构：六边形

　　晶胞参数：a = b = 0.395 nm, c = 0.666 nm, α = β = 90°, γ = 120°

　　晶体类型：合成

　　晶体纯度：＞99.995%

　　X-ray diffraction on a HfTe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 6 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4, 5, 6

　　Powder X-ray diffraction (XRD) of a single crystal . X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

　　Stoichiometric analysis of a single crystal by Energy-dispersive X-ray spectroscopy (EDX).

　　Raman spectrum of a single crystal . Measurement was performed with a 785 nm Raman system at room temperature.